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Tecniche avanzate in microscopia per l'analisi dei materiali
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ADVANCED TECHNIQUES IN MICROSCOPY FOR THE MATERIAL ANALYSIS
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Academic year 2014/2015
- Teacher
- Prof. Domenica Scarano (Titolare del corso)
- Year
- 1° anno 2° anno 3° anno
- Teaching period
- Annuale
- Type
- Obbligatorio
- Credits/Recognition
- 2
- Course disciplinary sector (SSD)
- CHIM/02 - chimica fisica
- Delivery
- Tradizionale
- Language
- Inglese
- Attendance
- Obbligatoria
- Type of examination
- Orale
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Sommario del corso
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Program
The main objectives of these lectures are: to give a general introduction of the SPM techniques; to esplain the principles of STM (Scanning Tunnelling Microscopy) and AFM (Atomic Force Microscopy); to focus on in-depth study of AFM (Atomic Force Microscopy), contact-mode, non-contact mode, intermittent contact mode or tapping mode; to explain the principles of high resolution AFM, of Kelvin Probe and Current sensing atomic force microscopies; to investigate
many materials and compare, when possible, with HRTEM and SEM analyses. to practice training at the AFM instrument and demonstrate the described methods.Suggested readings and bibliography
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Class schedule
Giorni Ore Aula Martedì 14:00 - 16:00 Aula Diagonale Dipartimento di Chimica Mercoledì 14:00 - 17:00 Aula Diagonale Dipartimento di Chimica Giovedì 14:00 - 17:00 Aula Diagonale Dipartimento di Chimica Lezioni: dal 15/12/2015 al 17/12/2015 - Oggetto:
Note
TIMETABLE and LOCATION
September - October 2015
Department of Chemistry Via Pietro Giuria 7 or 9
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